A1 Refereed original research article in a scientific journal
Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions
Authors: Kawai S, Canova FF, Glatzel T, Hynninen T, Meyer E, Foster AS
Publisher: AMER PHYSICAL SOC
Publication year: 2012
Journal: Physical Review Letters
Journal name in source: PHYSICAL REVIEW LETTERS
Journal acronym: PHYS REV LETT
Article number: ARTN 146101
Volume: 109
Issue: 14
Number of pages: 5
ISSN: 0031-9007
DOI: https://doi.org/10.1103/PhysRevLett.109.146101
Abstract
We provide unambiguous evidence that the applied electrostatic field displaces step atoms of ionic crystal surfaces by subpicometers in different directions via the measurement of the lateral force interactions by bimodal dynamic force microscopy combined with multiscale theoretical simulations. Such a small imbalance in the electrostatic interaction of the shifted anion-cation ions leads to an extraordinary long-range feature potential variation and is now detectable with the extreme sensitivity of the bimodal detection.
We provide unambiguous evidence that the applied electrostatic field displaces step atoms of ionic crystal surfaces by subpicometers in different directions via the measurement of the lateral force interactions by bimodal dynamic force microscopy combined with multiscale theoretical simulations. Such a small imbalance in the electrostatic interaction of the shifted anion-cation ions leads to an extraordinary long-range feature potential variation and is now detectable with the extreme sensitivity of the bimodal detection.
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