A4 Refereed article in a conference publication
A software tool for STED-AFM correlative super-resolution microscopy
Authors: Sami Koho, Takahiro Deguchi, Madis Löhmus, Tuomas Näreoja, Pekka E Hänninen
Editors: Thomas G. Brown; Carol J. Cogswell; Tony Wilson
Conference name: SPIE BiOS
Publication year: 2015
Journal: Proceedings of SPIE : the International Society for Optical Engineering
Book title : Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing
Volume: 9330
Number of pages: 7
ISSN: 0277-786X
DOI: https://doi.org/10.1117/12.2078624(external)
Multi-modal correlative microscopy allows combining the strengths of several
imaging techniques to provide unique contrast. However it is not always straightforward to
setup instruments for such customized experiments, as most microscope manufacturers use
their own proprietary software, with limited or no capability to interface with other instruments-
this makes correlation of the multi-modal data extremely challenging. We introduce a new
software tool for simultaneous use of a STimulated Emission Depletion (STED) ...
