Study of high power GaAs-based laser diodes operation and failure by cross-sectional electrostatic force microscopy
: Ankudinov A, Titkov A, Evtikhiev V, Kotelnikov E, Bazhenov N, Zegrya G, Huhtinen H, Laiho R
: 2003
Proceedings of SPIE : the International Society for Optical Engineering
10TH INTERNATIONAL SYMPOSIUM ON NANOSTRUCTURES: PHYSICS AND TECHNOLOGY
: P SOC PHOTO-OPT INS
: 5023
: 143
: 145
: 3
: 0-8194-4824-9
: 0277-786X
DOI: https://doi.org/10.1117/12.511837