Study of high power GaAs-based laser diodes operation and failure by cross-sectional electrostatic force microscopy




Ankudinov A, Titkov A, Evtikhiev V, Kotelnikov E, Bazhenov N, Zegrya G, Huhtinen H, Laiho R

2003

Proceedings of SPIE : the International Society for Optical Engineering

10TH INTERNATIONAL SYMPOSIUM ON NANOSTRUCTURES: PHYSICS AND TECHNOLOGY

P SOC PHOTO-OPT INS

5023

143

145

3

0-8194-4824-9

0277-786X

DOIhttps://doi.org/10.1117/12.511837




Last updated on 2025-14-10 at 09:39