High-speed thermal imaging is necessary in many applications. However,
the traditional column-wise readout implementations reduce the
achievable frame rate. Also, analog integration for each individual
pixel is not possible without sacrificing pixel area. In this brief, we
present an implementation of a fast and low-power pixel-wise readout
circuit scheme with a digital integration method using 65-nm standard
CMOS technology. The power consumption of the readout circuit is up to
15 μW and the layout area is 100 μm × 100 μm. Furthermore, we analyze
our design for non-idealities, such as noise and process mismatches
using a circuit simulator.