A1 Vertaisarvioitu alkuperäisartikkeli tieteellisessä lehdessä
Crystalline orientation and twin formation in YBCO thin films laser ablated from a nanocrystalline target
Tekijät: Paturi P, Peurla M, Nilsson K, Raittila J
Kustantaja: IOP PUBLISHING LTD
Julkaisuvuosi: 2004
Lehti:Superconductor Science and Technology
Tietokannassa oleva lehden nimiSUPERCONDUCTOR SCIENCE & TECHNOLOGY
Lehden akronyymi: SUPERCOND SCI TECH
Vuosikerta: 17
Numero: 3
Aloitussivu: 564
Lopetussivu: 570
Sivujen määrä: 7
ISSN: 0953-2048
DOI: https://doi.org/10.1088/0953-2048/17/3/043
Tiivistelmä
Two sets of superconducting thin films were deposited on SrTiO3 by laser ablation, the first using a nanocrystalline target (n-films) and the second using a commercial microcrystalline target (mu-films). The effect of film thickness on the structure of the films was investigated using detailed x-ray diffraction analysis. It was found that for both types of film growth is a three-phase process, where at the beginning some grains with their a-axis perpendicular to the substrate surface are formed. In the second phase a purely c-axis oriented film is formed and in the last phase some a-axis oriented grains are again observed. The last phase was observed only for the mu-films. Both types of film were found to have equal numbers of c-axis oriented grains oriented with their a-axis to the phi = 0degrees and to the 90degrees direction. It was also found that the twin structure observed in both types of film develops much faster in the n-films, which might be the reason for the observed high critical current densities in n-films.
Two sets of superconducting thin films were deposited on SrTiO3 by laser ablation, the first using a nanocrystalline target (n-films) and the second using a commercial microcrystalline target (mu-films). The effect of film thickness on the structure of the films was investigated using detailed x-ray diffraction analysis. It was found that for both types of film growth is a three-phase process, where at the beginning some grains with their a-axis perpendicular to the substrate surface are formed. In the second phase a purely c-axis oriented film is formed and in the last phase some a-axis oriented grains are again observed. The last phase was observed only for the mu-films. Both types of film were found to have equal numbers of c-axis oriented grains oriented with their a-axis to the phi = 0degrees and to the 90degrees direction. It was also found that the twin structure observed in both types of film develops much faster in the n-films, which might be the reason for the observed high critical current densities in n-films.
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