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The Growth Rate and Temperature Induced Microcracks in YBCO Films Pulsed Laser Deposited on MgO Substrates




TekijätHuhtinen H, Palonen H, Paturi P

KustantajaIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

Julkaisuvuosi2013

JournalIEEE Transactions on Applied Superconductivity

Tietokannassa oleva lehden nimiIEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY

Lehden akronyymiIEEE T APPL SUPERCON

Artikkelin numero7200104

Numero sarjassa3

Vuosikerta23

Numero3

Sivujen määrä4

ISSN1051-8223

DOIhttps://doi.org/10.1109/TASC.2012.2228891


Tiivistelmä
The growth rate and temperature dependence on microcrack formation in YBCO thin films prepared by pulsed laser deposition on MgO (100) substrate is systematically investigated by varying the laser pulse frequency between 1 and 20 Hz and the deposition temperature between 650 degrees C and 850 degrees C. Atomic force microscopy shows that when the growth temperature is high enough, >= 800 degrees C, the higher thermal energy and increased surface mobility during the growth induce a process where adsorbed atoms have more time to find energetically optimal sites, which again result in microcrack formation along the diagonal of a/b-directions in the film. In case of MgO substrate where lattice mismatch in the orthorhombic phase is 8.5% and YBCO grows under tensile strain on it, the growth of YBCO relaxes by rotating the unit cells by 45 degrees in-plane from the substrate (100) and/or (010) directions. The structural defects and reorganization of the material reflect also in the superconducting properties, which are clearly suppressed at high deposition temperatures and with the increasing growth rate. These effects should be taken into account when the pinning structure and superconducting properties of YBCO are optimized for future applications realized on single crystal substrate having small dielectric constant.


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