Influence of Substrate Temperature on CeF3 Thin Films prepared by Thermal Evaporation




Arun Kumar Dorai, Selvasekarapandian Subramanian, Nithya Hellar, Jarkko Leiro

PublisherELSEVIER SCIENCE SA

LAUSANNE; PO BOX 564, 1001 LAUSANNE, SWITZERLAND

2014

Materials Chemistry and Physics

Materials Chemistry and Physics

Mater. Chem. Phys.

143

2

765

772

8

0254-0584

DOIhttps://doi.org/10.1016/j.matchemphys.2013.10.011



We have investigated the effect of substrate temperature on the structural, compositional and electrical properties of cerium fluoride thin films prepared by thermal evaporation method. The structure of cerium fluoride is hexagonal and the growth orientation changes with increase in substrate temperature. The substrate temperature favors the growth of vertical nanorods on the surface of the thin films. The compositional analysis confirms the formation of cerium oxyfluoride, leading to free fluoride ions. Electrical conductivity increases with increasing substrate temperature. (C) 2013 Elsevier B.V. All rights reserved.



Last updated on 2024-26-11 at 12:48