Characterization of an Yb:LuVO4 single crystal using X-ray topography, high-resolution X-ray diffraction, and X-ray photoelectron spectroscopy
: W Paszkowicz, P Romanowski, J Bak-Misiuk, W Wierzchowski, K Wieteska, W Graeff, R J Iwanowski, M H Heinonen, O Ermakova, H Dabkowska
: 2011
: Radiation Physics and Chemistry
: 10
: 80
: 10
: 1001
: 1007
: 7
: 0969-806X
DOI: https://doi.org/10.1016/j.radphyschem.2011.03.001