A4 Vertaisarvioitu artikkeli konferenssijulkaisussa

RF NoC: A New Paradigm for Very Large Scale Three Dimensional On-Chip Interconnect Networks

Tekijät: Yin A W, Lv G, Tao C, Liljeberg P, Tenhunen H

Julkaisuvuosi: 2010

Journal: Proceedings : Design, Automation, and Test in Europe Conference and Exhibition

Kokoomateoksen nimi: Proceeding of 3D Integration Workshop in Design Automation and Test Europe Conference (DATE)

ISSN: 1530-1591