RF NoC: A New Paradigm for Very Large Scale Three Dimensional On-Chip Interconnect Networks

: Yin A W, Lv G, Tao C, Liljeberg P, Tenhunen H

: 2010

: Proceedings : Design, Automation, and Test in Europe Conference and Exhibition

: Proceeding of 3D Integration Workshop in Design Automation and Test Europe Conference (DATE)

: 1530-1591