A1 Refereed original research article in a scientific journal
Self-Adaptive System for Addressing Permanent Errors in On-Chip Interconnects
Authors: Lehtonen T, Wolpert D, Liljeberg P, Plosila J, Ampadu P
Publisher: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Publication year: 2010
Journal: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Journal name in source: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
Journal acronym: IEEE T VLSI SYST
Number in series: 4
Volume: 18
Issue: 4
First page : 527
Last page: 540
Number of pages: 14
ISSN: 1063-8210
DOI: https://doi.org/10.1109/TVLSI.2009.2013711(external)
Abstract
We present a self-contained adaptive system for detecting and bypassing permanent errors in on-chip interconnects. The proposed system reroutes data on erroneous links to a set of spare wires without interrupting the data flow. To detect permanent errors at runtime, a novel in-line test (ILT) method using spare wires and a test pattern generator is proposed. In addition, an improved syndrome storing-based detection (SSD) method is presented and compared to the ILT method. Each detection method (ILT and SSD) is integrated individually into the noninterrupting adaptive system, and a case study is performed to compare them with Hamming and Bose-Chaudhuri-Hocquenghem (BCH) code implementations. In the presence of permanent errors, the probability of correct transmission in the proposed systems is improved by up to 140% over the standalone Hamming code. Furthermore, our methods achieve up to 38% area, 64% energy, and 61% latency improvements over the BCH implementation at comparable error performance.
We present a self-contained adaptive system for detecting and bypassing permanent errors in on-chip interconnects. The proposed system reroutes data on erroneous links to a set of spare wires without interrupting the data flow. To detect permanent errors at runtime, a novel in-line test (ILT) method using spare wires and a test pattern generator is proposed. In addition, an improved syndrome storing-based detection (SSD) method is presented and compared to the ILT method. Each detection method (ILT and SSD) is integrated individually into the noninterrupting adaptive system, and a case study is performed to compare them with Hamming and Bose-Chaudhuri-Hocquenghem (BCH) code implementations. In the presence of permanent errors, the probability of correct transmission in the proposed systems is improved by up to 140% over the standalone Hamming code. Furthermore, our methods achieve up to 38% area, 64% energy, and 61% latency improvements over the BCH implementation at comparable error performance.
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