A4 Refereed article in a conference publication
Analysis of delay variation in encoded on-chip bus signaling under process variation
Authors: Tuuna S, Nigussie E, Isoaho J, Tenhunen H
Publication year: 2008
Journal: VLSI Design
Book title : 21st International Conference on VLSI Design
Journal name in source: 21ST INTERNATIONAL CONFERENCE ON VLSI DESIGN: HELD JOINTLY WITH THE 7TH INTERNATIONAL CONFERENCE ON EMBEDDED SYSTEMS, PROCEEDINGS
Journal acronym: I CONF VLSI DESIGN
First page : 228
Last page: 234
Number of pages: 7
ISBN: 978-0-7695-3083-3
ISSN: 1063-9667
DOI: https://doi.org/10.1109/VLSI.2008.73
Abstract
In this paper we model on-chip signaling over a bus consisting of encoding, drivers, transmission lines, receivers and decoding. We characterize the signaling circuitry as a function of its load capacitance. The effective load capacitance seen by a driver is derived for the decoupling method and distributed RLC transmission line models. The driver delay and rise time corresponding to the derived effective capacitance are used to derive the far-end voltage of a transmission line bus. The effects of process variation are taken into account in the characterization of the signaling circuitry and in the wire analysis. The overall delay variation of the bus due to device and wire process variation is then calculated. The model is verified by comparing it to HSPICE. We implement regular voltage mode, level-encoded dual-rail and 1-of-4 signaling circuitry and apply the derived model to analyze them. The implementation and analysis are done in 45 nm technology.
In this paper we model on-chip signaling over a bus consisting of encoding, drivers, transmission lines, receivers and decoding. We characterize the signaling circuitry as a function of its load capacitance. The effective load capacitance seen by a driver is derived for the decoupling method and distributed RLC transmission line models. The driver delay and rise time corresponding to the derived effective capacitance are used to derive the far-end voltage of a transmission line bus. The effects of process variation are taken into account in the characterization of the signaling circuitry and in the wire analysis. The overall delay variation of the bus due to device and wire process variation is then calculated. The model is verified by comparing it to HSPICE. We implement regular voltage mode, level-encoded dual-rail and 1-of-4 signaling circuitry and apply the derived model to analyze them. The implementation and analysis are done in 45 nm technology.
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