XPS characterization of single crystalline SrLaGa3O7:Nd

: R J Iwanowski, M H Heinonen, I Prackac, J Kachniarz

Publisher: ELSEVIER SCIENCE BV

: 2013

Applied Surface Science

: APPLIED SURFACE SCIENCE

: APPL SURF SCI

: 283

: 168

: 174

: 7

: 0169-4332

DOI: https://doi.org/10.1016/j.apsusc.2013.06.075

Core-level XPS studies of single crystalline SrLaGa3O7 (SLGO) doped with Nd have been performed for the first time. The detailed analysis of the main XPS core lines of SLGO:Nd included the comparative literature data for the selected oxide compounds containing La and/or Sr, Nd or Ga cations. In particular, the binding energies (BEs) of the Ln 3d(5/2) core levels (Ln = La, Nd) in SLGO:Nd were found consistent with the relevant ones for the La- and Nd-based oxides considered, thus indicating that they represent the ground final states of La3+ and Nd3+ ions (respectively) in the crystal lattice after photoexcitation. Analogous consistency has been found for the XPS-derived BEs of the Sr 3d(5/2) and Ga 2p(3/2) core levels related to the Sr2+ and Ga3+ cationic states in SLGO and the corresponding oxide compounds. Generally, the binding energies of the deep core levels of cations in SLGO:Nd and the other oxides considered are mainly determined by their common oxygen ligand, irrespectively of the crystalline structure. (C) 2013 Elsevier B.V. All rights reserved.

Core levels, Lanthanides, Oxide compounds, SrLaGa3O7, XPS