A1 Refereed original research article in a scientific journal

Interface characterization of Co2MnGe/Rh2CuSn Heusler multilayers




AuthorsRonny Knut, Peter Svedlindh, Oleg Mryasov, Klas Gunnarsson, Peter Warnicke, D A Arena, Matts Björck, Andrew J C Dennison, Anindita Sahoo, Sumanta Mukherjee, D D Sarma, Sari Granroth, Mihaela Gorgoi, Olof Karis

PublisherAMER PHYSICAL SOC

Publishing placeCOLLEGE PK; ONE PHYSICS ELLIPSE, COLLEGE PK, MD 20740-3844 USA

Publication year2013

JournalPhysical Review B

Journal name in sourcePhysical Review B

Journal acronymPhys.Rev.B

Number in series13

Volume88

Issue13

First page 134407

Last page134407

Number of pages8

ISSN1098-0121

DOIhttps://doi.org/10.1103/PhysRevB.88.134407


Abstract
To address the amount of disorder and interface diffusion induced by annealing, all-Heusler multilayer structures, consisting of ferromagnetic Co2MnGe and nonmagnetic Rh2CuSn layers of varying thicknesses, have been investigated by means of hard x-ray photoelectron spectroscopy and x-ray magnetic circular dichroism. We find evidence for a 4 angstrom thick magnetically dead layer that, together with the identified interlayer diffusion, are likely reasons for the unexpectedly small magnetoresistance found for current-perpendicular-to-plane giant magnetoresistance devices based on this all-Heusler system. We find that diffusion begins already at comparably low temperatures between 200 and 250 degrees C, where Mn appears to be most prone to diffusion.



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