A4 Article in conference proceedings
Observation of strained SiGe nanoislands embedded in a Si matrix using ambient crosssectional atomic force microscopy




List of Authors: Titkov A., Dunaevskii M., Krasilnik Z., Lobanov D., Novikov A., Laiho R.
Publisher: CRC Press
Place: Boca Raton, FL
Publication year: 2018
Book title *: Microscopy of Semiconducting Materials 2003: Proceedings of the Institute of Physics Conference, Cambridge University, 31 March- 3 April 2003
Journal name in source: Microscopy of Semiconducting Materials 2003
eISBN: 978-1-351-07463-6



Internal Authors/Editors

Last updated on 2019-20-07 at 03:55